JESD-47 Historical Revision Information
Stress-Test-Driven Qualification of Integrated Circuits

JESD-47 - REVISION J.01 - SUPERSEDED
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Stress-Test-Driven Qualification of Integrated Circuits

Abstract

The standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.

This qualification standard is not aimed at extreme use conditions such as military applications, automotive under-the-hood applications, or uncontrolled avionics environments, nor does it address 2nd level reliability considerations, which are addressed in JEP150.

Tables in the standard list qualification requirements not only for new components but also for a qualification family or category of change.  It is expected that the IC sampling lot will pass all appropriate qualification tests derived from these tables.


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Document Number

JESD47J.01

Revision Level

REVISION J.01

Status

Superseded

Publication Date

Sept. 20, 2017

Page Count

30 pages