MIL-PRF-19500/343 › Complete Document History
Transistor, NPN, Silicon, Low Power, Encapsulated (Through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Types 2N2857, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC
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REVISION M/AM 3 - REVISION M WITH AMENDMENT 3 INTERFILED - May 1, 2023
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Obsolete Revision Information: |
REVISION M/AM 2 - REVISION M WITH AMENDMENT 2 INTERFILED - Nov. 2, 2022
REVISION M/AM 1 - REVISION M WITH AMENDMENT 1 INTERFILED - Dec. 6, 2017
REVISION M - Transistor, NPN, Silicon, Low Power, Encapsulated (Through-H - Nov. 3, 2016
REVISION L - and Unencapsulated, Radiation Hardness Assurance, Types 2N28 - July 22, 2015
REVISION K/AM 1 - REVISION K/AMENDMENT 1 INTERFILED - March 25, 2014
REVISION K - Semiconductor Device, Transistor, NPN, Silicon, Low Power, T - May 1, 2012
REVISION J - Semiconductor Device, Transistor, NPN, Silicon, Low Power, T - April 2, 2010
REVISION H - Semiconductor Device, Transistor, NPN, Silicon, Low Power, T - March 20, 2008
REVISION G - Semiconductor Device, Transistor, NPN, Silicon, Low Power, T - March 18, 2005
REV F AMENDMENT 1 - AMENDMENT 1 FOR REVISION F - Aug. 16, 2002
REVISION F - Semiconductor Device, Transistor, NPN, Silicon, Low Power, T - Feb. 8, 2002
REVISION E - Semiconductor Device, Transistor, NPN, Silicon, Low Power, T - Nov. 28, 2000
REV D AMENDMENT 2 - AMENDMENT 2 FOR REVISION D - May 10, 2000
REV D AMENDMENT 1 - AMENDMENT 1 FOR REVISION D - April 8, 1998
REVISION D - Semiconductor Device, Transistor, NPN, Silicon, Low Power, T - Dec. 10, 1997
REVISION C - Semiconductor Device, Transistor, NPN, Silicon, Low Power, T - June 18, 1997
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