MIL-PRF-19500/604 | Semiconductor Device, Field Effect Radiation Hardened (Total Dose Characterization Only) Transistors, N-Channel, Silicon, Types 2N7272, 2N7275, 2N7278, and 2N7281, JANTXVM, D, and R, and JANSM, D, and R | Document Center, Inc.

MIL-PRF-19500/604 › Complete Document History
Semiconductor Device, Field Effect Radiation Hardened (Total Dose Characterization Only) Transistors, N-Channel, Silicon, Types 2N7272, 2N7275, 2N7278, and 2N7281, JANTXVM, D, and R, and JANSM, D, and R

Obsolete Revision Information:

   REV C CANCELLATION 1 - CANCELLATION NOTICE 1 FOR REVISION C - Aug. 17, 2023
   REVISION C - Transistor, Field Effect Radiation Hardened N-Channel, Silicon, Types 2N7272, 2N7275, 2N7278, and 2N7281, JANTXV, and JANS - March 17, 2018
   REV B VALIDATION 2 - VALIDATION NOTICE 2 FOR REVISION B - May 24, 2016
   REV B VALIDATION 1 - VALIDATION NOTICE 1 FOR REVISION B - July 14, 2011
   REVISION B - Semiconductor Device, Field Effect Radiation Hardened (Total Dose Characterization Only) Transistors, N-Channel, Silicon, Types 2N7272, 2N7275, 2N7278, and 2N7281, JANTXVM, D, and R, and JANSM, D, and R - July 30, 2004
   REV A AMENDMENT 1 - AMENDMENT 1 FOR REVISION A - Sept. 14, 2001
   REVISION A - TRANSISTORS, N-CHANNEL, SILICO - June 21, 1999