MIL-PRF-19500/657 › Complete Document History
Semiconductor Device, Field Effect, Radiation Hardened, Transistor Die, N and P-Channel, Silicon Various Types JANHC and JANKC
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REVISION C - Transistor, Silicon, N and P-Channel, Field Effect, Radiation Hardened, Unencapsulated Die, Various Types, Quality Levels JANHC and JANKC - March 10, 2020
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Obsolete Revision Information: |
REV B VALIDATION 1 - VALIDATION NOTICE 1 FOR REVISION B - Dec. 9, 2015
REVISION B - Semiconductor Device, Field Effect, Radiation Hardened, Transistor Die, N and P-Channel, Silicon Various Types JANHC and JANKC - Jan. 26, 2011
REV A VALIDATION 1 - VALIDATION NOTICE 1 FOR REVISION A - Dec. 6, 2004
REVISION A - SILICON, VARIOUS TYPES JANHC, - Feb. 22, 2000
BASE - SEMICONDUCTOR DEVICE, FIELD EF - Dec. 23, 1997
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