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Scope

This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in the various parts of this standard cover basic environmental, physical, and electrical tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts.

Notes

Claudia's Notes:
The last time this entire test method standard was revised, it was issued in six parts.  This included the basic test method standard, MIL-STD-750, and five numbered parts. This was done in order to provide flexibility in the use and the updating of the test methods.

The six parts are listed as follows:
MIL–STD–750 – Test Methods For Semiconductor Devices.
MIL–STD–750–1 – Environmental Test Methods For Semiconductor Devices.
MIL–STD–750–2 – Mechanical Test Methods For Semiconductor Devices.
MIL–STD–750–3 – Electrical Characteristics Tests for Bipolar, MOSFET, and Gallium Arsenide Transistors.
MIL–STD–750–4 – Electrical Characteristics Tests for Diodes, Microwave Diodes, Thyristors, and Tunnel Diodes.
MIL–STD–750–5 – High Reliability Space Application Test Methods For Semiconductor Devices.

To find similar documents by Federal Supply Class Code:

FSC 5961 (Semiconductor Devices and Associated Hardware)

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