ASTM-D1830 › Historical Revision Information
Standard Test Method for Thermal Endurance of Flexible Sheet Materials Used for Electrical Insulation by the Curved Electrode Method
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1.1 This test method provides a procedure for evaluating thermal endurance of flexible sheet materials by determining dielectric breakdown voltage at room temperature after aging in air at selected elevated temperatures. Thermal endurance is expressed in terms of a temperature index.
1.2 This test method is applicable to such solid electrical insulating materials as coated fabrics, dielectric films, composite laminates, and other materials where retention of flexibility after heat aging is of major importance (see Note 0).
1.3 This test method is not intended for the evaluation of rigid laminate materials nor for the determination of thermal endurance of those materials which are not expected or required to retain flexibility in actual service.
1.4 The values stated in acceptable metric units are to be regarded as the standard. The values in parentheses are for information only.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Significance and Use
A major factor affecting the life of insulating materials is thermal degradation. Other factors, such as moisture and vibration, may cause failures after the material has been weakened by thermal degradation.
Electrical insulation is effective in electrical equipment only as long as it retains its physical and electrical integrity. Thermal degradation may be characterized by weight change, porosity, crazing, and generally a reduction in flexibility, and is usually accompanied by an ultimate reduction in dielectric breakdown voltage.
curved electrode; dielectric breakdown voltage; flexible sheets; temperature index; thermal endurance; thermal endurance graph; thermal life; thermal life curve
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1999 R05 EDITION
Oct. 1, 2005