ASTM-E2444 › Historical Revision Information
Terminology Relating to Measurements Taken on Thin, Reflecting Films
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Scope
1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.
1.2 The terms are listed in alphabetical order.
Keywords
ICS Number Code 01.040.31 (Electronics (Vocabularies)); 31.240 (Mechanical structures for electronic equipment)
To find similar documents by ASTM Volume:
03.01 (Metals -- Mechanical Testing; Elevated and Low-Temperature Tests; Metallography)
To find similar documents by classification:
01.040.31 (Electronics (Vocabularies))
31.240 (Mechanical structures for electronic equipment)
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Document Number
ASTM-E2444-05e1
Revision Level
2005(E1) EDITION
Status
Superseded
Modification Type
Editorially changed
Publication Date
Jan. 1, 2006
Document Type
Terminology
Page Count
3 pages
Committee Number
E08.02