ASTM-F1893 › Complete Document History
Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)


Obsolete Revision Information:
   2018 EDITION - Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices - March 1, 2018
   2011 EDITION - Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices - Jan. 1, 2011
   1998 R03 EDITION - REAPPROVED IN 2003 - Dec. 1, 2003
   1998 EDITION - MEASUREMENT OF IONIZING DOSE-R - May 10, 1998