ASTM-F1996 › Historical Revision Information
Standard Test Method for Silver Migration for Membrane Switch Circuitry
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Scope
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.
Significance and Use
The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.
Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA).
Keywords
membrane switch; silver dendrite; silver migration; ICS Number Code 77.120.99 (Other non-ferrous metals and their alloys)
To find similar documents by ASTM Volume:
10.04 (Electronics; Declarable Substances in Materials; 3D Imaging Systems)
To find similar documents by classification:
77.120.99 (Other non-ferrous metals and their alloys)
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Document Number
ASTM-F1996-06
Revision Level
2006 EDITION
Status
Superseded
Modification Type
Revision
Publication Date
July 1, 2006
Document Type
Test Method
Page Count
2 pages
Committee Number
F01.18