ASTM-F24 › Historical Revision Information
Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces
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Scope
1.1 This method covers the size distribution analysis of particulate contamination, 5 m or greater in size, either on, or washed from, the surface of small electron-device components. A maximum variation of two to one (33 % of the average of two runs) should be expected for replicate counts on the same sample.
Note 1--For satisfactory results on clean parts, it is recommended that all procedures involved in sample preparation be conducted under a dust shield.
Keywords
optical particle counting; particulate contamination; size distribution analysis; surfaces; ICS Number Code 17.040.20 (Properties of surfaces)
To find similar documents by ASTM Volume:
15.03 (Space Simulation; Aerospace and Aircraft; Composite Materials)
To find similar documents by classification:
17.040.20 (Properties of surfaces)
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Document Number
ASTM-F24-65(1976)
Revision Level
1965 R76 EDITION
Status
Superseded
Modification Type
Revision
Publication Date
Aug. 31, 1965
Document Type
Test Method
Page Count
4 pages
Committee Number
E21.05