ASTM-F24 › Historical Revision Information
Standard Method for Measuring and Counting Particulate Contamination on Surfaces
The following bibliographic material is provided to assist you with your purchasing decision:
This test method establishes the standard procedures for measuring and quantizing the size distribution of particulate contamination either on, or washed from, the surface of small electron-device components. The apparatus and reagents required for this test are also enumerated herein. The number of required test specimens is governed by the dimensions of the component or surface being analyzed. Results shall be interpreted as particles per component or particles per square centimetre of component surface.
Scope
1.1 This method covers the size distribution analysis of particulate contamination, 5 m or greater in size, either on, or washed from, the surface of small electron-device components. A maximum variation of two to one (33 % of the average of two runs) should be expected for replicate counts on the same sample.
Note 1--For satisfactory results on clean parts, it is recommended that all procedures involved in sample preparation be conducted under a dust shield.
Keywords
optical particle counting; particulate contamination; size distribution analysis; surfaces; ICS Number Code 17.040.20 (Properties of surfaces)
To find similar documents by ASTM Volume:
15.03 (Space Simulation; Aerospace and Aircraft; Composite Materials)
To find similar documents by classification:
17.040.20 (Properties of surfaces)
This document comes with our free Notification Service, good for the life of the document.
This document is available in either Paper or PDF format.
Document Number
ASTM-F24-04
Revision Level
2004 EDITION
Status
Superseded
Modification Type
Revision
Publication Date
Sept. 1, 2004
Document Type
Test Method
Page Count
4 pages
Committee Number
E21.05