ASTM-F24 › Historical Revision Information
Standard Method for Measuring and Counting Particulate Contamination on Surfaces
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This test method establishes the standard procedures for measuring and quantizing the size distribution of particulate contamination either on, or washed from, the surface of small electron-device components. The apparatus and reagents required for this test are also enumerated herein. The number of required test specimens is governed by the dimensions of the component or surface being analyzed. Results shall be interpreted as particles per component or particles per square centimetre of component surface.
Scope
1.1 This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum variation of two to one (±33 % of the average of two runs) should be expected for replicate counts on the same sample.
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
Keywords
optical particle counting; particulate contamination; size distribution analysis; surfaces; Particulate contamination (aerospace environments); Size/size distribution analysis; Surface analysis--aerospace materials; ICS Number Code 17.040.20 (Properties of surfaces)
To find similar documents by ASTM Volume:
15.03 (Space Simulation; Aerospace and Aircraft; Composite Materials)
To find similar documents by classification:
17.040.20 (Properties of surfaces)
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Document Number
ASTM-F24-09
Revision Level
2009 EDITION
Status
Superseded
Modification Type
Revision
Publication Date
April 1, 2009
Document Type
Test Method
Page Count
4 pages
Committee Number
E21.05