ASTM-F744M › Complete Document History
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)


Obsolete Revision Information:
   2016 EDITION - Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) - May 15, 2016
   2010 EDITION - Measuring Dose Rate Threshold for Upset of Digital Integrate - May 1, 2010
   1997 R03 EDITION - REAPPROVED IN 2003 - June 10, 2003
   1997 EDITION - Measuring Dose Rate Threshold for Upset of Digital Integrate - Feb. 10, 1997