BS-9400 › Historical Revision Information
Specification for Integrated Electronic Circuits and Micro-Assemblies of Assessed Qualit

BS-9400 - REPLACED BY BS-CECC-90000 - SUPERSEDED -- See the following: BS-CECC-90000
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Specification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test

Keywords

Qualification approval;Temperature measurement;Capacitance measurement;Test equipment;Testing conditions;Specification (approval);Ratings;Detail specification;Environmental testing;Performance testing;Definitions;Solvent-resistance tests;Electrical testing;Circuits;Marking;Symbols;Defects;Leak tests;Electronic equipment and components;Graphic symbols;Voltage measurement;Sampling methods;Quality assurance systems;Radiographic testing;Approval testing;Statistical quality control;Quality control;Inspection;Assessed quality;Time measurement;Short-circuit current tests;Impedance measurement;Current measurement;Safety measures;Electrical measurement;Thermal testing;Endurance testing;Integrated circuits;Solderability testing

To find similar documents by classification:

31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

BS-9400

Revision Level

REPLACED BY BS-CECC-90000

Status

Superseded

Publication Date

Jan. 20, 2009

Committee Number

EPL/47