BS-EN-60749-13 › Historical Revision Information
Semiconductor Devices, Mechanical & Climatic Test Methods, Salt Atmosphere
BS-EN-60749-13
-
2002 EDITION
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SUPERSEDED
-- See the following:
BS-EN-IEC-60749-13
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Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere
Keywords
Corrosion resistance;Electronic equipment and components;Accelerated corrosion tests;Integrated circuits;Destructive testing;Environmental testing;Mechanical testing;Salts;Salt-spray tests;Accelerated testing;Climate;Semiconductor devices
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
Document Number
BS EN 60749-13:2002
Revision Level
2002 EDITION
Status
Superseded
Publication Date
Sept. 17, 2002
Replaces Notes
BS EN 60749:1999
Replaced By
BS EN IEC 60749-13:2018
Page Count
10
ISBN
0580402932
International Equivalent
EN 60749-13 (IEC 60749-13:2002) AS;IEC 60749-13:2002
Committee Number
EPL/47