BS-EN-60749-2 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-60749-2
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2002 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Integrated circuits;Pressure;Electronic equipment and components;Semiconductor devices;Climate;Air;Low-pressure tests;Mechanical testing;Environmental testing
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-2:2002
Revision Level
2002 EDITION
Status
Current
Publication Date
Sept. 24, 2002
Replaces Notes
BS EN 60749:1999
Page Count
10
ISBN
0580403971
International Equivalent
EN 60749-2:2002;IEC 60749-2:2002
Committee Number
EPL/47