BS-EN-60749-20 › Complete Document History
Semiconductor devices. Mechanical and climatic test methods


Obsolete Revision Information:
   REPLACED BY BS-EN-IEC-60749-20 - WITHDRAWN IN 2020 - Oct. 14, 2020
   2009 EDITION - Semiconductor devices. Mechanical and climatic test methods. Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat - Jan. 31, 2010
   2003 EDITION - ENCAPSULATED SMDS TO THE COMBI - July 7, 2003