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Semiconductor devices. Mechanical and climatic test methods


Obsolete Revision Information:
   REPLACED BY BS-EN-IEC-60749-28 - WITHDRAWN IN 2022 - Sept. 6, 2022
   2017 EDITION - Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level - July 10, 2017