BS-EN-60749-28 › Historical Revision Information
Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level.

BS-EN-60749-28 - REPLACED BY BS-EN-IEC-60749-28 - SUPERSEDED
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Electrostatics;Electric charge;Electronic equipment and components;Electric discharges;Mechanical testing;Semiconductor devices;Test methods;Environmental testing;Integrated circuits

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31.080.01 (Semiconductor devices in general)

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Document Number

BS-EN-60749-28

Revision Level

REPLACED BY BS-EN-IEC-60749-28

Status

Superseded

Publication Date

Sept. 6, 2022

International Equivalent

IEC 60749-28:2017;EN 60749-28:2017

Committee Number

EPL/47

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BS-EN-60749-28 › Historical Revision Information Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level.