BS-EN-60749-30 › Historical Revision Information
Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing

BS-EN-60749-30 - REPLACED BY BS-EN-IEC-60749-30 - SUPERSEDED
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Semiconductor devices;Electronic equipment and components;Mechanical testing;Performance testing;Specimen preparation;Environmental testing;Reliability;Climate;Surface mounting devices;Integrated circuits

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS-EN-60749-30

Revision Level

REPLACED BY BS-EN-IEC-60749-30

Status

Superseded

Publication Date

Sept. 30, 2020

International Equivalent

EN 60749-30:2005/A1:2011;IEC 60749-30:2005;IEC 60749-30:2005/AMD1:2011

Committee Number

EPL/47