BS-EN-60749-35 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-60749-35
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2006 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Integrated circuits;Mechanical testing;Non-destructive testing;Microscopic analysis;Semiconductor devices;Plastics;Encapsulated;Electronic equipment and components;Test equipment;Environmental testing;Packages;Ultrasonic testing;Climate
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-35:2006
Revision Level
2006 EDITION
Status
Current
Publication Date
Nov. 30, 2006
Page Count
24
ISBN
0580497399
International Equivalent
IEC 60749-35:2006;EN 60749-35:2006;IEC 60749-35:2006;EN 61140:2002
Committee Number
EPL/47