BS-ISO-22493 › Historical Revision Information
Microbeam analysis. Scanning electron microscopy. Vocabulary

BS-ISO-22493 - 2008 EDITION - SUPERSEDED
Show Complete Document History

Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:

Microbeam analysis. Scanning electron microscopy. Vocabulary

Keywords

Electron beams;Electron optics;Scanning electron microscopes;Instrumental methods of analysis;Optical instruments;Terminology;Vocabulary;Microscopes;Electron microscopes

To find similar documents by classification:

01.040.37 (Image technology (Vocabularies))

01.040.71 (Chemical technology (Vocabularies))

37.020 (Optical equipment Including microscopes, telescopes, binoculars, optical materials, optical components and optical systems Ophthalmic equipment, see 11.040.70 Optical measuring instruments, see 17.180.30 Photographic equipment lenses, see 37.040.10)

71.040.50 (Physicochemical methods of analysis Including spectrophotometric and chromatographic analysis)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

ORDER



Document Number

BS ISO 22493:2008

Revision Level

2008 EDITION

Status

Superseded

Publication Date

Oct. 31, 2008

Replaced By

BS ISO 22493:2014

Page Count

34

ISBN

9780580549878

International Equivalent

ISO 22493:2008

Committee Number

CII/9