DESC-DWG-5962-91725 › Complete Document History
Microcircuit, Digital, Bipolar CMOS, Scan Test Device with Octal D-Type Latch, Three-State Outputs, Monolithic Silicon
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REVISION C - Octal D-Type Latch, Three-State Outputs, Monolithic Silicon - June 22, 2021
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Obsolete Revision Information: |
REVISION B - Microcircuit, Digital, Bipolar CMOS, Scan Test Device with Octal D-Type Latch, Three-State Outputs, Monolithic Silicon - March 25, 2015
REVISION A - MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH O - Aug. 11, 2008
BASE - MICROCIRCUIT, DIGITAL, BIPOLAR - Jan. 6, 1994
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