DESC-DWG-5962-91725 › Historical Revision Information
Microcircuit, Digital, Bipolar CMOS, Scan Test Device with Octal D-Type Latch, Three-State Outputs, Monolithic Silicon
Microcircuit, Digital, Bipolar CMOS, Scan Test Device with Octal D-Type Latch, Three-State Outputs, Monolithic Silicon
To find similar documents by Federal Supply Class Code:
FSC 5962 (Microcircuits, Electronic)
This document comes with our free Notification Service, good for the life of the document.
This document is available in either Paper or PDF format.
Document Number
DESC-DWG-5962-91725
Revision Level
REVISION A
Status
Superseded
Publication Date
Aug. 11, 2008
Page Count
22 pages