DESC-DWG-5962-93186 | Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with Octal Bus Transceiver with Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon | Document Center, Inc.

DESC-DWG-5962-93186 › Complete Document History
Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with Octal Bus Transceiver with Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon

Complete Current Edition:

REVISION C - Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Devi - Sept. 9, 2013

Obsolete Revision Information:

   REVISION B - Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Devi - May 30, 2007
   CHANGE REVISION A - NOTICE OF REVISION A FOR BASE - March 11, 1994
   BASE - MICROCIRCUIT, DIGITAL, ADVANCE - Jan. 24, 1994