DESC-DWG-5962-93186 › Historical Revision Information
Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with Octal Bus Transceiver with Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon

DESC-DWG-5962-93186 - CHANGE REVISION A - SUPERSEDED
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Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with Octal Bus Transceiver with Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon


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FSC 5962 (Microcircuits, Electronic)

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Document Number

DESC-DWG-5962-93186

Revision Level

CHANGE REVISION A

Status

Superseded

Publication Date

March 11, 1994

Page Count

2 pages