DESC-DWG-5962-94672 › Historical Revision Information
Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Universal Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monlithic Silicon

DESC-DWG-5962-94672 - REVISION A - SUPERSEDED
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Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Universal Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monlithic Silicon


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FSC 5962 (Microcircuits, Electronic)

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Document Number

DESC-DWG-5962-94672

Revision Level

REVISION A

Status

Superseded

Publication Date

May 30, 2007

Page Count

30 pages