DESC-DWG-5962-94672 › Complete Document History
Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Universal Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monlithic Silicon
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REVISION C - Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Universal Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon - Oct. 25, 2023
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Obsolete Revision Information: |
REVISION B - Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Universal Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monlithic Silicon - July 25, 2013
REVISION A - BUS TRANSCEIVER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, - May 30, 2007
BASE - MICROCIRCUIT, DIGITAL, ADVANCE - June 8, 1994
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