DESC-DWG-5962-94672 › Historical Revision Information
Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Universal Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monlithic Silicon
Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Universal Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monlithic Silicon
To find similar documents by Federal Supply Class Code:
FSC 5962 (Microcircuits, Electronic)
Document Number
DESC-DWG-5962-94672
Revision Level
REVISION B
Status
Superseded
Publication Date
July 25, 2013
Page Count
28 pages