DESC-DWG-5962-95614 | Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Universal Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon | Document Center, Inc.

DESC-DWG-5962-95614 › Complete Document History
Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Universal Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon

Complete Current Edition:

REVISION C - Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon - Oct. 5, 2021

Obsolete Revision Information:

   REVISION B - Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Universal Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon - Feb. 24, 2015
   REVISION A - TRANSCEIVER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MON - July 21, 2008
   BASE - MICROCIRCUIT, DIGITAL, ADVANCE - Oct. 13, 1995