DESC-DWG-5962-95614 › Historical Revision Information
Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Universal Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon
Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Universal Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon
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FSC 5962 (Microcircuits, Electronic)
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Document Number
DESC-DWG-5962-95614
Revision Level
REVISION A
Status
Superseded
Publication Date
July 21, 2008
Page Count
30 pages