EN-15991 › Historical Revision Information
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

EN-15991 - 2011 EDITION - SUPERSEDED -- See the following: BS-EN-15991 DIN-EN-15991
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Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)


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81.060.10 (Raw materials)

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Document Number

EN-15991

Revision Level

2011 EDITION

Status

Superseded

Publication Date

Jan. 1, 2011