IEC-1580-9 Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces

IEC-1580-9 - 1ST EDITION - CURRENT


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Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.
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Document Number

IEC 61580-9 Ed. 1.0 b:1996

Revision Level

1ST EDITION

Status

Current

Publication Date

June 1, 1996

Committee Number

46F