IEC-60749-1 › Semiconductor devices - Mechanical and climatic test methods - Part 1: General

IEC-60749-1 - EDITION 1.0 - CURRENT -- See the following: IEC-749


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 EDITION 1.0 - Aug. 1, 2002
 ED. 1.0 CORRIGENDUM 1 - Aug. 1, 2003

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
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Document Number

IEC 60749-1 Ed. 1.0 b:2002

Revision Level

EDITION 1.0

Status

Current

Publication Date

Aug. 1, 2002

Committee Number

47