IEC-60749-18 › Historical Revision Information
Part 18: Ionizing Radiation (Total Dose), Semiconductor Devices - Mechanical & Climatic Te
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Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.
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31.080.01 (Semiconductor devices in general)
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Document Number
IEC 60749-18 Ed. 1.0 b:2002
Revision Level
1ST EDITION
Status
Superseded
Publication Date
Dec. 1, 2002
Committee Number
47