IEC-60749-27 › Complete Document History
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Complete Current Edition:
   EDITION 2.1 - CONSOLIDATES AMENDMENT 1 - Sept. 25, 2012

Obsolete Revision Information:
   FOR 2ND EDITION AMENDMENT 1 - IEC-60749-27-AM1 - Sept. 25, 2012
   2ND EDITION - SEMICONDUCTOR DEVICES - MECHANICAL & CLIMATIC TEST METHODS - July 1, 2006
   1ST EDITION - SEMICONDUCTOR DEVICES - MECHAN - Oct. 1, 2003