IEC-60749-27 › Historical Revision Information
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
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Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive
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31.080.01 (Semiconductor devices in general)
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Document Number
IEC 60749-27 Ed. 1.0 b:2003
Revision Level
1ST EDITION
Status
Superseded
Publication Date
Oct. 1, 2003
Committee Number
47