IEC-60749-30 | Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing | Document Center, Inc.

IEC-60749-30 › Complete Document History
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Complete Current Edition:

EDITION 2.0 - Semiconductorhermetic surface mount devices prior to reliability testing - Aug. 1, 2020

Obsolete Revision Information:

   EDITION 1.1 - CONSOLIDATES AMENDMENT 1 - Aug. 1, 2011
   FOR AMENDMENT 1 - IEC-60749-30-AM1 - May 1, 2011
   1ST EDITION - TESTING, SEMICONDUCTOR DEVICES - MECHANICAL & CLIMATIC TEST - Jan. 20, 2005