IEC-60749-4 › Historical Revision Information
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

IEC-60749-4 - 1ST EDITION CORRIGENDUM 1 - SUPERSEDED
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Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
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31.080.01 (Semiconductor devices in general)

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Document Number

IEC 60749-4 Ed. 1.0 b Cor.1:2003

Revision Level

1ST EDITION CORRIGENDUM 1

Status

Superseded

Publication Date

Aug. 1, 2003

Committee Number

47