IEC-60749-4 › Historical Revision Information
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
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Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
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31.080.01 (Semiconductor devices in general)
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Document Number
IEC 60749-4 Ed. 1.0 b:2002
Revision Level
1ST EDITION
Status
Superseded
Publication Date
April 1, 2002
Committee Number
47