IEC-61967-4 › Historical Revision Information
Part 4: Measurement of Conducted Emissions - 1 / 150 Direct Coupling Method, Integrat

IEC-61967-4 - 1ST EDITION CORRIGENDUM 1 - SUPERSEDED
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Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
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31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

IEC 61967-4 Ed. 1.0 b cor.1:2017

Revision Level

1ST EDITION CORRIGENDUM 1

Status

Superseded

Publication Date

Jan. 1, 2017

Committee Number

47A