IEC-61967-4 › Historical Revision Information
Part 4: Measurement of Conducted Emissions - 1 / 150 Direct Coupling Method, Integrat

IEC-61967-4 - 1ST EDITION - SUPERSEDED
Show Complete Document History

Document Center Inc. is an authorized dealer of IEC standards.
The following bibliographic material is provided to assist you with your purchasing decision:


Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods.
ORDER

To find similar documents by classification:

31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

Document Number

IEC 61967-4 Ed. 1.0 b:2002

Revision Level

1ST EDITION

Status

Superseded

Publication Date

April 1, 2002

Committee Number

47A