IEC-63287-1 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification

IEC-63287-1 - EDITION 1.0 - CURRENT

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IEC 63287-1:2021 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications.
NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified.
NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.
This first edition of IEC 63287-1 cancels and replaces the first edition of IEC 60749-43 published in 2017. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
  1. the document has been renamed and renumbered to distinguish it from the IEC 60749 (all parts);
  2. a new section concerning the concept of "family" has been added with appropriate renumbering of the existing text.



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Document Number

IEC 63287-1 Ed. 1.0 b:2021

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Publication Date

Aug. 1, 2021

Committee Number