ASTM-E665 › Historical Revision Information
Using Absorbed Dose Versus Depth in Materials To Verify THEX-Ray Output of Flash X-Ray Ma
Show Complete Document History
The following bibliographic material is provided to assist you with your purchasing decision:
Scope
1.1 This practice covers a procedure for determining absorbed dose versus depth in materials exposed to the X-ray output of flash X-ray machines. It is applicable to all machines whose photon energy spectra have maximum energies ranging from 100 keV to 20 MeV. The determination provides information related to the photon spectrum from the flash X-ray machine. Specifically this measurement can be used for verifying expected X-ray spectra obtained from machine diagnostics and radiation transport calculations and for determining the appropriate equilibrator thickness to be used for dosimetric measurements.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Keywords
Absorbed radiation dose; Dosimetry; Energy deposition-ionizing radiation; Flash X-ray machines (FXR); Threshold detectors-100 keV to 20 MeV; X-irradiation; absorbed dose versus depth in materials exposed to flash X-ray machines,; practice; ICS Number Code 17.240 (Radiation measurements)
To find similar documents by ASTM Volume:
12.02 (Nuclear (II), Solar, and Geothermal Energy)
To find similar documents by classification:
17.240 (Radiation measurements Including dosimetry Radiation protection, see 13.280)
To find similar documents by Federal Supply Class Code:
FSC 59GP (Electrical and Electronic Equipment Components -- General)
Document Number
ASTM-E665-78
Revision Level
1978 EDITION
Status
Superseded
Modification Type
Withdrawn
Publication Date
Nov. 24, 1978
Document Type
Practice
Page Count
4 pages
Committee Number
E10.07