ASTM-E673 › Historical Revision Information
Standard Terminology Relating to Surface Analysis

ASTM-E673 - 1989 EDITION - SUPERSEDED
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Standard Terminology Relating to Surface Analysis (Withdrawn 2012)
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Scope

1.1 This terminology is related to the various disciplines involved in surface analysis.

1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).

Keywords

terminology; ICS Number Code 01.040.17 (Metrology and measurement. Physical phenomena (Vocabularies)); 17.040.20 (Properties of surfaces)

To find similar documents by ASTM Volume:

03.06 (Molecular Spectroscopy; Surface Analysis)

To find similar documents by classification:

01.040.17 (Metrology and measurement. Physical phenomena (Vocabularies))

17.040.20 (Properties of surfaces)

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Document Number

ASTM-E673-89

Revision Level

1989 EDITION

Status

Superseded

Modification Type

Editorially changed

Publication Date

Feb. 24, 1989

Document Type

Terminology

Page Count

9 pages

Committee Number

E42.02