ASTM-F867M › Historical Revision Information
Ionizing Radiation Effects (Total Dose) Testing of Semiconductor Devices (Metric), Standar
ASTM-F867M
-
1994 EDITION
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SUPERSEDED
-- See the following:
ASTM-F1893
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Guide for Ionizing Radiation Effects (Total Dose) Testing of Semiconductor Devices [Metric] (Withdrawn 1998)
Keywords
ICS Number Code 17.240 (Radiation measurements); 31.080.01 (Semi-conductor devices in general)
To find similar documents by ASTM Volume:
10.04 (Electronics; Declarable Substances in Materials; 3D Imaging Systems)
To find similar documents by classification:
17.240 (Radiation measurements Including dosimetry Radiation protection, see 13.280)
31.080.01 (Semiconductor devices in general)
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This document is available in Paper format.
Document Number
ASTM-F867M-94
Revision Level
1994 EDITION
Status
Superseded
Modification Type
Replaced
Publication Date
April 15, 1994
Document Type
Guide
Page Count
7 pages