BS-EN-60749-15 › Historical Revision Information
Semiconductor Devices, Mechanical & Climatic Test Methods, Resistance To Soldering Tem

BS-EN-60749-15 - 2003 EDITION - SUPERSEDED
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Mechanical testing;Solderability testing;Climate;Slots;Destructive testing;Encapsulated;Electronic equipment and components;Holes;Integrated circuits;Semiconductor devices;Thermal testing;Soldering;Environmental testing

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749-15:2003

Revision Level

2003 EDITION

Status

Superseded

Publication Date

June 19, 2003

Replaces Notes

BS EN 60749:1999

Replaced By

BS EN 60749-15:2010;BS EN 60749-15:2010

Page Count

10

ISBN

0580420612

International Equivalent

IEC 60749-15:2003;EN 60749-15:2003

Committee Number

EPL/47