BS-EN-60749-15 › Historical Revision Information
Semiconductor Devices, Mechanical & Climatic Test Methods, Resistance To Soldering Tem
Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:
The following bibliographic material is provided to assist you with your purchasing decision:
Semiconductor devices. Mechanical and climatic test methods
Keywords
Soldering;Environmental testing;Solderability testing;Slots;Destructive testing;Semiconductor devices;Encapsulated;Holes;Integrated circuits;Climate;Thermal testing;Electronic equipment and components;Mechanical testing
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
Document Number
BS EN 60749-15:2010
Revision Level
2010 EDITION
Status
Superseded
Publication Date
June 30, 2011
Replaces
BS EN 60749-15:2003
Replaced By
BS EN IEC 60749-15:2020
Page Count
10
ISBN
9780580747120
International Equivalent
EN 60749-15:2010/AC:2011;IEC 60749-15:2010
Committee Number
EPL/47