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Semiconductor devices. Mechanical and climatic test methods

Complete Current Edition:
   REPALCED BY BS-EN-IEC-60749-39 - WITHDRAWN IN 2022 - March 7, 2022

Obsolete Revision Information:
   2006 EDITION - Semiconductor devices. Mechanical and climatic test methods. Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components - Dec. 29, 2006