BS-EN-60749-39 › Historical Revision Information
Semiconductor devices. Mechanical and climatic test methods. Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Solubility;Environmental testing;Diffusion;Moisture measurement;Water;Moisture control;Mechanical testing;Electronic equipment and components;Semiconductor devices
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
Document Number
BS-EN-60749-39
Revision Level
REPALCED BY BS-EN-IEC-60749-39
Status
Current
Publication Date
March 7, 2022
International Equivalent
IEC 60749-39:2006;EN 60749-39:2006
Committee Number
EPL/47